Orthogonal Defect Classification is a classification of the defects that the organization has produced. This provides a
source of past defects and a roadmap of where to look for future defects.
IBM first published a set of categories using their defect database as the basis for the classification. Others have
proposed addiitonal categories particular to their environment.
The basic idea is to look for a classification scheme that will be useful in defining review and test procedures.
Chillarege, R., Bhandari, I., Chaar, J., Halliday, M., Moebus, D., Ray, B., and Wong, M. "Orthogonal Defect
Classification -- A Concept for In-Process Measurements," IEEE TSE, vol. 18, no. 11 (Nov. 1992), pp. 943-956.
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